Lab Services and Reliability Testing
Lab Services and Reliability Testing Team
- Our facility is an independent 3rd party test lab with 30 years of proven experience
- We are a Center of Competence for reliability engineering testing and failure analysis of microelectronics for many applications including:
- Military Platforms
- Supercomputing
- Medical Devices
- Automotive Devices
- Telecommunications
- And others
- We specialize in supplier Qualification Testing, and Materials Analysis
i3 has a variety of reliability testing capability including:
Accelerated Life Testing
- Accelerated Thermal Cycling (ATC)
- Deep Thermal Cycle (DTC)
- JEDEC Testing
- High Temperature Storage
Accelerated Life Testing focus on electrical opens:
Custom designed testing based on field operating conditions or risk site analysis.
- Mean time to failure determinations
- Identification of product risk sites
- Component failure rates
Accelerated Testing focus on electrical shorts:
- Partner with our customers to design testing strategy based on field operating conditions, or risk site analysis
- Surface Insulation Resistance testing (SIR)
- Cathode Anodic Filament Testing (CAF)
- Risk site electro migration concerns
Humidity Testing
- Temperature and Humidity w/bias (THB)
- High Accelerated Stress Testing (HAST)
- Cyclic Temperature and Humidity
- Autoclave (Pressure Cooker)
Why Choose i3?
Electrical Monitoring/Data Acquisition System for computer controlled resistance/current/voltage measurements
- Relays and Interface Board for 960 channels per Tester
- Independent of Test Chambers (Mobile)
- High Precision Read-Outs -> HP3458A Meters
- Automated Continuous Monitoring
- Multi-Bias (Voltage) Measurements
